Butler
John M. Butler is NIST Fellow and Group Leader of Applied Genetics at the National Institute of Standards and Technology. He is author of the internationally acclaimed textbook Forensic DNA Typing—now in its third edition—as well as more than 100 scientific articles and invited book chapters. His book was also been translated into Chinese (2007) and Japanese (2009). He earned his Ph.D in 1995 from the University of Virginia with Ralph Allen (Analytical Chemistry). His Ph.D.